Controlling electric polarization of ferroelectric materials via an applied electric field is widely used in electronic devices. To scale the size of this latter a local control of the polarization is mandatory as well as the stability of well-defined polarized state in distinct submicron and nano-scaled regions of the materials. Scanning probe microscopy using a biased tip allows to study both. Thus, non-volatile behavior as well as the low frequency dynamic of the local polarization can be study for future application in ultrahigh information and/or piezoelectric actuators devices. In this frame, the Piezoelectric Force Microscopy (PFM) will be presented to show advantages and drawbacks of the technic. Afterward, results obtained on several different structures will be addressed depending on the time. To show the versatility of the PFM technic, very different organic and inorganic materials are proposed:

o Lead Zirconate Titanate commercial materials have been characterized for a comparative study with macroscopic piezoelectric coefficient toward a quantitative PFM;
o Nanoscale switching dynamics of ferroelectric domain and domain growth studies are addressed in granular PZT thin film for grain-pinning effect and reversal velocity detection;
o PVDF & composite micrometric film have been studied to show the robustness of their piezoelectric coefficient after metallic inclusions; a mechanical stretching PFM combined study has also been done to demonstrate the possible enhancement of the piezoelectric phase of the PVDF.